TestMemModelSCDRF00 Class Reference

test_mm_sc_drf_00: Testing SC-DRF non-atomic global read and write within an atomic acquire/release critical block. More...

Collaboration diagram for TestMemModelSCDRF00:

Public Member Functions
	TestMemModelSCDRF00 ()
void	test01_Read1Write1 ()
void	test02_Read2Write1 ()
void	test03_Read4Write1 ()
void	test11_Read10Write10 ()
void	test12_Read10Write10 ()
void	test_list ()

Detailed Description

test_mm_sc_drf_00: Testing SC-DRF non-atomic global read and write within an atomic acquire/release critical block.

Modified non-atomic memory within the atomic acquire (load) and release (store) block, must be visible for all threads according to memory model (MM) Sequentially Consistent (SC) being data-race-free (DRF).
See Herb Sutter's 2013-12-23 slides p19, first box "It must be impossible for the assertion to fail – wouldn’t be SC.".

This test's threads utilize a spin-lock, waiting for their turn. Such busy cycles were chosen to simplify the test and are not recommended as they expose poor performance on a high thread-count and hence long 'working thread pipe'.

See 'test_mm_sc_drf_01' implementing same test using mutex-lock and condition wait.

Examples

test_mm_sc_drf_00.cpp.

Definition at line 57 of file test_mm_sc_drf_00.cpp.

Constructor & Destructor Documentation

TestMemModelSCDRF00()

TestMemModelSCDRF00::TestMemModelSCDRF00 ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 152 of file test_mm_sc_drf_00.cpp.

Member Function Documentation

test01_Read1Write1()

void TestMemModelSCDRF00::test01_Read1Write1 ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 155 of file test_mm_sc_drf_00.cpp.

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test02_Read2Write1()

void TestMemModelSCDRF00::test02_Read2Write1 ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 165 of file test_mm_sc_drf_00.cpp.

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test03_Read4Write1()

void TestMemModelSCDRF00::test03_Read4Write1 ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 189 of file test_mm_sc_drf_00.cpp.

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test11_Read10Write10()

void TestMemModelSCDRF00::test11_Read10Write10 ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 205 of file test_mm_sc_drf_00.cpp.

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test12_Read10Write10()

void TestMemModelSCDRF00::test12_Read10Write10 ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 225 of file test_mm_sc_drf_00.cpp.

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test_list()

void TestMemModelSCDRF00::test_list ( )

inline

Examples

test_mm_sc_drf_00.cpp.

Definition at line 245 of file test_mm_sc_drf_00.cpp.

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The documentation for this class was generated from the following file:

• jaulib/test/test_mm_sc_drf_00.cpp